The SurfaceSeer: Surface Analysis by TOF-SIMS
SurfaceSeer is a compact, affordable, TOF-SIMS designed for ease of use and speed of data acquisition. All the spectrometer tuning has been pre-set in the electronics, so that the surface chemistry of insulating, metals and semiconductor samples can be determined quickly and efficiently.
The SurfaceSeer is available in two forms:
The SurfaceSeer-S is designed to be a 'work horse' for spectroscopy in both positive and negative TOF-SIMS modes, and has a mass resolution of better than 2500.
The SurfaceSeer-I is designed to produce chemical maps in both positive and negative TOF-SIMS modes with an analytical spatial resolution of around 0.5µm and a mass resolution of better than 3000.
Both instruments provide the power of surface analysis, at less than one quarter of the cost of high-end research TOF-SIMS instruments.
Last updated: 17:10 12/03/2014
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