Research TOF-MS Systems

Example systems

• Research TOF-SIMS
• TOF-MS Cassegrain
• TOF-SIMS
• Gas TOFMS
• PTR TOFMS
• Photolysis TOFMS
• R-500 TOF-SIMS
• PI TOFMS
• Linear TOFMS
• Bio TOFMS
• UHV lens system
• PTR/EI Quadrupole MS
• PTR/APCI TOF-MS
• PTR-TOF-HT

Components for Custom and DIY Systems

• TOF source modules
• Matching optics (focussing/deflection)
• Flight tubes & liners
• Reflectrons
• Detectors & preamplification
• Data acquisition/processing
• Database options
• Viewing Optics

• Timing modules

  • Histogramming TDC (2 ns)
  • TDC (0.25 ns)
  • Analogue

• Power supplies

  • TOF-MS Voltage Controller
  • Floating Detector
  • TOF-MS Logic Controller
  • TOF-MS High Voltage Supplies
  • Mains Distribution

• Sample Stages and Sample Handling

  • Generic Stage
  • Cold Stage
  • Rotating Stage
  • Cryo-sample preparation

Vacuum analysis/processing

Example systems

• Cryo-preparation system
• UHV processing rig
• Multi-technique surface analysis
• Laser ablation coating
• Ion beam polishing system
• Turntable for beam-line surface analysis
• 0.1-100 kV wide beam electron source

Components

• CCTV sample viewing with zoom
• Fast entry lock
• Cold fracture stage
• Laser focussing (bakeable cassegrain)
• Mains distribution & bakeout control

• Sample Stages and Sample Handling

  • Generic Stage
  • Cold Stage
  • Rotating Stage for Cameca IMS
  • Cryo-sample preparation

Standard TOF-MS Systems

• The SurfaceSeer: Surface Analysis by TOF-SIMS
• Portable TOF Mass Spectrometer
• Low Cost Static TOF-SIMS instrument
• Mini TOF

• Upgrades for SIMS Instruments

  • Kratos
  • VG

Agencies

• Electron Multiplier detectors (Burle)
• Position sensitive detectors (Quantar)
• LaB₆,CeB₆ Cathodes, STM tips & single crystal W wire(AP-TECH)
• Mass spectral library (NIST)

Analysis Services

• On-site VOCs analysis